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BTS030 Backplane Characterization Techniques

BTS030 Backplane Characterization Techniques

By Eric Bogatin, published in the Xcell Journal, Summer 2004.
This is a general overview paper on some of the challenges of fixturing and measuring the electrical properties of backplane interconnects, such as launches, ensuring enough measurement bandwidth, generating eye diagrams from the S-Parameters, and how to interpret the S-Parameters.

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